Novel X-ray/gamma-ray Detectors - Capital Equipment
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Whilst many X-ray and gamma-ray detector technologies exist (including Si, GaAs, SiC, and CdZnTe), InGaP devices are a highly attractive alternative which occupy a sweet spot in performance. They are capable of all three desirable properties: good energy resolution, high linear absorption coefficients, and high temperature operation. As such, they are a valuable commercial proposition, with many uses in multiple fields, including: nuclear power, scientific research, mining, healthcare, security and defence, and material sterilisation. InGaP radiation detectors are being developed at University of Sussex, where they are also being prepared for commercialisation. This IPS Capital application would provide funds to purchase three items of much needed equipment which will make the technical and commercial development of the detectors more rapid:
1) a semiconductor probe station - this is a piece of equipment that allows temporary electrical connections to be made to bare die semiconductor devices before they are packaged.
2) a parameter analyser - this is a piece of test and measurement equipment that enables the characteristics of the detectors to be measured.
3) a wire-bonder - this is a tool which allows permanent electrical connections to be made between devices on a semiconductor die and the semiconductor packaging.
University of Sussex will contribute £50k in cash towards the requested equipment and also commit 20% of Barnett's time for 5 years (£207.6k including overheads and estates costs) to the development and commercialisation of the novel detectors, and to ensure that the equipment requested is properly used, managed, and maintained during and beyond the grant's lifetime.
University of Sussex | LEAD_ORG |
Optocap (United Kingdom) | PP_ORG |
Anna Barnett | PI_PER |
Subjects by relevance
- Detectors
- Semiconductors
- Electrical devices
Extracted key phrases
- Ray detector technology
- Novel x
- Novel detector
- Ray Detectors
- Capital Equipment
- Ingap radiation detector
- Die semiconductor device
- IPS Capital application
- Gamma
- Semiconductor probe station
- Measurement equipment
- Semiconductor die
- High linear absorption coefficient
- Permanent electrical connection
- Semiconductor packaging